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Temperature Dependence of the Piezoelectric Coefficient in BiMeO 3 ‐ PbTiO 3 ( Me = Fe , Sc , ( Mg 1/2 Ti 1/2 )) Ceramics
Author(s) -
Leist Thorsten,
Chen Jun,
Jo Wook,
Aulbach Emil,
Suffner Jens,
Rödel Jürgen
Publication year - 2012
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2011.04848.x
Subject(s) - piezoelectricity , materials science , temperature coefficient , piezoelectric coefficient , antiresonance , dielectric , inflection point , atmospheric temperature range , poling , permittivity , ceramic , diffraction , analytical chemistry (journal) , mineralogy , condensed matter physics , ferroelectricity , optics , composite material , thermodynamics , physics , chemistry , mathematics , geometry , optoelectronics , chromatography
The piezoelectric coefficient of high temperature piezoelectric ceramics, denoted as Bi(Me)O 3 ‐ PbTiO 3 , ( Me = Fe , Sc , ( Mg 1/2 Ti 1/2 )) was investigated as a function of temperature by using a custom‐designed test frame. Utilizing laser vibrometry, it was possible to assess the piezoelectric coefficient in situ in the range from room temperature to 500°C. The constraints on the sample geometry as they exist in the commonly used resonance/antiresonance technique such as those encountered during poling were circumvented by the use of the converse piezoelectric effect. Comparison with literature data revealed that the current method is a useful alternative for determining the depolarization temperature ( T d ), defined as the inflection point in a temperature‐dependent d 33 plot. Measured T d for each poled specimen was compared with that determined by dielectric permittivity as well as temperature‐dependent X‐ray diffraction data to understand a possible origin of T d . It was also shown that T d matches with the temperature where the dielectric anomaly initiates, and hence T d from the d 33 measurement is consistently lower than that from the dielectric permittivity measurement. It is proposed that this discrepancy in the position of T d is due to the fact that the depolarization occurs in two steps.