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Electrode Defects in Multilayer Capacitors Part II: Finite Element Analysis of Local Field Enhancement and Leakage Current in Three‐Dimensional Microstructures
Author(s) -
Samantaray Malay M.,
Gurav Abhijit,
Dickey Elizabeth C.,
Randall Clive A.
Publication year - 2012
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2011.04768.x
Subject(s) - microstructure , materials science , electric field , composite material , electrode , leakage (economics) , dielectric , capacitor , porosity , miniaturization , voltage , optoelectronics , electrical engineering , nanotechnology , chemistry , physics , quantum mechanics , economics , macroeconomics , engineering
Multilayer ceramic capacitors ( MLCC s), owing to their processing conditions, can exhibit microstructure defects, such as electrode porosity and roughness. The effect of such extrinsic defects on the electrical performance of these devices needs to be understood to achieve successful miniaturization. To understand the influence of microstructural defects on field distributions and leakage current, the three‐dimensional (3‐D) microstructure of a local region in MLCC s is reconstructed using a serial‐sectioning technique in the focused ion beam. This microstructure is then converted into a finite element model to simulate the perturbations in electric field due to the presence of electrode defects. The electric field is significantly enhanced in the vicinity of such defects, and this is expected to have a bearing on the leakage current density of these devices. To simulate the scaling effects, the dielectric layer thickness is reduced in the 3‐D microstructure keeping the same electrode morphology. It is seen that the effect of microstructure defects is more pronounced as one approaches thinner layers, leading to higher local electric field concentrations and a concomitant drop in insulation resistance.