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A Special Configuration of Lead Zirconate Titanate Multilayer Stack with Superior Electrical and Optical Properties
Author(s) -
Zhang Ting,
Hu GuJin,
Bu HaiJun,
Cong Rui,
Chen Xin,
Yu GuoLin,
Meng XiangJian,
Chu JunHao,
Dai Ning
Publication year - 2011
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2011.04701.x
Subject(s) - materials science , dielectric , optoelectronics , ferroelectricity , annealing (glass) , lead zirconate titanate , polarization (electrochemistry) , band gap , optics , composite material , chemistry , physics
A unique configuration of PbZr 0.4 Ti 0.6 O 3 multilayer stack was designed and grown on F ‐doped tin oxide thin film by spin casting and annealing process. The multilayer system exhibits a broad reflection band with peak reflectivity over 95% and band width no < 40 nm, a dielectric constant of 520 and dielectric tunability of ~49% at 1 MHz, a remanent polarization of 46.8 μ C/cm 2 , and a polarization loss of < 5% after 10 9 polarization switching cycles, rendering excellent performance as 1D photonic crystals and as ferroelectric and dielectric media. This material structure may find application in photonic band‐gap engineering, microwave tunable devices, and integrated optoelectronics.