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Ultra‐Low‐Fire Te 2 (Mo 1− x W x )O 7 Ceramics: Microstructure and Microwave Dielectric Properties
Author(s) -
Wang SeaFue,
Wang YuhRuey,
Hsu YungFu,
Lu HsiChuan,
Tsai JungShiung
Publication year - 2010
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2010.04010.x
Subject(s) - microstructure , sintering , materials science , ceramic , monoclinic crystal system , dielectric , analytical chemistry (journal) , microwave , mineralogy , scanning electron microscope , x ray crystallography , transmission electron microscopy , diffraction , crystallography , crystal structure , optics , metallurgy , composite material , nanotechnology , chemistry , physics , optoelectronics , chromatography , quantum mechanics
The sintering temperatures of common microwave dielectric ceramics fall in the range between 1200° and 1500°C. In this study, prepared new microwave dielectric ceramics of Te 2 (Mo 1− x W x )O 7 showed a sintering temperature of 520°C. Only monoclinic ( P 2 1 /c ) Te 2 (Mo 1− x W x )O 7 phase was found in the X‐ray diffraction patterns after sintering, an observation further confirmed by high‐resolution transmission electron microscopy results. Microstructures were composed of angular grains in the sizes of 2–5 μm. The microwave dielectric properties of pure Te 2 MoO 7 and Te 2 (Mo 0.95 W 0.05 )O 7 ceramics sintered at 520°C can be summarized as ɛ r ≈13.6, Q × f ≈46 900 GHz, and τ f ≈−36.0 ppm/°C and ɛ r ≈13.9, Q × f ≈25 820 GHz, and τ f ≈−12.8 ppm/°C.