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Effect of Pyrolysis Temperature on K 0.5 Na 0.5 NbO 3 Thick Films Derived from Polyvinylpyrrolidone‐Modified Chemical Solution
Author(s) -
Wang Lingyan,
Ren Wei,
Yao Kui,
Goh Phoi Chin,
Shi Peng,
Wu Xiaoqing,
Yao Xi
Publication year - 2010
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2010.03965.x
Subject(s) - materials science , dielectric , pyrolysis , x ray photoelectron spectroscopy , analytical chemistry (journal) , crystallinity , ferroelectricity , annealing (glass) , permittivity , dielectric loss , mineralogy , chemical engineering , composite material , chemistry , organic chemistry , optoelectronics , engineering
Lead‐free ferroelectric K 0.5 Na 0.5 NbO 3 (KNN) thick films with improved performances have been successfully prepared by polyvinylpyrrolidone‐modified chemical solution deposition method. The KNN thick films were obtained by pyrolyzing at different temperatures and annealing at 600°C. The effect of pyrolysis temperature on structures and electrical properties of KNN thick films is studied. The crystallinity of KNN films decreased with the increasing of the pyrolysis temperature, and the porous morphology is observed in the KNN films pyrolyzed at 480°C. However, the film pyrolyzed at 330°C is dense. With the analysis of X‐ray photoelectron spectroscopy for K ions, it was found that a low pyrolysis temperature favors the formation of perovskite KNN phase. Therefore, the electrical properties of the KNN films became improved at the low pyrolysis temperature. The KNN film pyrolyzed at 330°C and annealed at 600°C exhibits the large dielectric constant of 685 and low dielectric loss of 6.95%. The film also shows the saturated and symmetric polarization–electric field ( P – E ) loops with remnant polarization of 12 μC/cm 2 and piezoelectric coefficient d 33 of 56 pm/V.