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Phase Composition and Photoluminescence Properties of Radio‐Frequency Sputtered Pure and Sm 3+ ‐Doped ZrO 2 Thin Films
Author(s) -
Nayak Pramoda Kumar,
Kao WeiJung,
Sahu Diptiranjan,
Huang JowLay,
Sahu Diptiranjan,
Huang JowLay
Publication year - 2010
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2010.03881.x
Subject(s) - photoluminescence , monoclinic crystal system , materials science , tetragonal crystal system , doping , cubic zirconia , analytical chemistry (journal) , annealing (glass) , crystallite , thin film , sputtering , luminescence , mineralogy , crystal structure , crystallography , ceramic , nanotechnology , chemistry , optoelectronics , metallurgy , chromatography
Pure and Sm 3+ (0.33, 0.46, 1.48, and 2.19 at.%)‐doped ZrO 2 thin films have been prepared using radio‐frequency (RF) sputtering technique. The phase composition and photoluminescence (PL) properties have been studied on these pure and doped thin films as a function of annealing temperature and doping concentration. Phase composition analysis indicates the increment in the monoclinic content and crystallite size of the pure sample with the increase in annealing temperature. Higher doping promotes the tetragonal phase of the material. From PL studies, Sm 3+ (0.33 at.%)‐doped zirconia thin film shows a stronger emission spectra than other higher doping. All doped samples exhibit a well‐resolved emission series of Sm 3+ at higher annealing temperatures. The effect of structural modifications on the PL spectra of the zirconia system has been investigated. Monoclinic phase promotes the luminescence efficiency of this system. PL study shows one to one correspondence with that of structural modification of zirconia system.