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Unusual Curie Point Independence of Thickness and Interfacial Properties for Perfectly (111)‐Oriented Ba 0.6 Sr 0.4 TiO 3 Thin Films
Author(s) -
Yang Lihui,
Wang Genshui,
Dong Xianlin,
Rémiens Denis
Publication year - 2010
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2010.03877.x
Subject(s) - permittivity , curie temperature , materials science , thin film , dielectric , lattice constant , sputter deposition , phase transition , condensed matter physics , relative permittivity , curie , analytical chemistry (journal) , sputtering , composite material , mineralogy , optics , chemistry , nanotechnology , optoelectronics , ferromagnetism , diffraction , physics , chromatography
This study investigated the variations in the permittivity with film thickness and measurement temperature of perfectly (111)‐oriented Ba 0.6 Sr 0.4 TiO 3 thin films with thicknesses ranging from 45 to 800 nm, which were prepared by RF magnetron sputtering on Pt/TiO x /SiO 2 /Si substrates. All the films showed elongations in the lattice parameter, suggesting the presence of residual strains but which were insensitive to the film thickness. The temperature‐dependent measurement of the permittivity revealed an unusual Curie point independent of thickness, about 305±5 K, where the phase transition appeared frustrated. The thickness‐dependent permittivity at a given temperature was explained by using the interfacial intrinsic low‐permittivity layer model reported previously.