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Failure Mechanism of a Low‐Temperature‐Cofired Ceramic Capacitor with an Inner Ag Electrode
Author(s) -
Shih YiTing,
Jean JauHo,
Lin ShihChang
Publication year - 2010
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2010.03837.x
Subject(s) - materials science , ceramic capacitor , composite material , sintering , ceramic , capacitor , electrode , microstructure , dielectric , leakage (economics) , diffusion , electrical impedance , voltage , electrical engineering , optoelectronics , chemistry , thermodynamics , physics , economics , macroeconomics , engineering
Failure mechanism of a multilayer ceramic capacitor (MLCC) made of a low‐fire BaNd 2 Ti 4 O 12 (BNT)+ZnO–B 2 O 3 (ZB) dielectric with an inner pure silver electrode at elevated temperatures and voltages has been investigated. A nonlinear current–voltage leakage characteristic is found when the degradation of MLCC occurs, and the time to failure decreases with increasing either the temperature or the voltage. Results of microstructure, composition, and impedance analyses reveal that the failure is caused by silver diffusion in the ZB glass during sintering and highly accelerated life test.