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Cathode–Electrolyte Interfaces with CGO Barrier Layers in SOFC
Author(s) -
Knibbe Ruth,
Hjelm Johan,
Me Mohan,
Pryds Nini,
Søgaard Martin,
Wang Hsiang Jen,
Neufeld Kai
Publication year - 2010
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2010.03763.x
Subject(s) - materials science , cathode , electrolyte , transmission electron microscopy , yttria stabilized zirconia , barrier layer , scanning electron microscope , layer (electronics) , solid oxide fuel cell , electron backscatter diffraction , oxide , pulsed laser deposition , scanning transmission electron microscopy , analytical chemistry (journal) , chemical engineering , composite material , microstructure , thin film , nanotechnology , chemistry , metallurgy , cubic zirconia , electrode , ceramic , chromatography , engineering
Electron microscopy characterization across the cathode–electrolyte interface of two different types of intermediate temperature solid oxide fuel cells (IT‐SOFC) is performed to understand the origin of the cell performance disparity. One IT‐SOFC cell had a sprayed‐cosintered Ce 0.90 Gd 0.01 O 1.95 (CGO10) barrier layer, the other had a barrier layer deposited by pulsed laser deposition (PLD) CGO10. Scanning electron microscopy, transmission electron microscopy (TEM), and electron backscattered diffraction (EBSD) investigations conclude that the major source of the cell performance difference is attributed to CGO–YSZ interdiffusion in the sprayed‐cosintered barrier layer. From TEM and EBSD work, a dense CGO10 PLD layer is found to be deposited epitaxially on the 8YSZ electrolyte substrate—permitting a small amount of SrZrO 3 formation and minimizing CGO–YSZ interdiffusion.