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Dielectric and Grain‐Boundary Characteristics of Hot Pressed CaCu 3 Ti 4 O 12
Author(s) -
Kim Byeong Kon,
Lee Hyung Sub,
Lee Jung Won,
Lee Seung Eun,
Cho Yong Soo
Publication year - 2010
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2010.03738.x
Subject(s) - grain boundary , materials science , dielectric , permittivity , grain size , phase (matter) , mineralogy , hot pressing , atmosphere (unit) , condensed matter physics , composite material , analytical chemistry (journal) , microstructure , chemistry , thermodynamics , optoelectronics , physics , organic chemistry , chromatography
Effects of hot pressing (HP) on the dielectric and grain‐boundary characteristics of copper titanate (CaCu 3 Ti 4 O 12 or CCTO) materials were studied with the comparison of conventionally prepared samples. HP at 1100°C in N 2 atmosphere resulted in uniformly distributed smaller grain sizes and less Cu‐rich grain boundaries, without the accompanying secondary CuO phase. The high effective permittivity of ∼3 × 10 4 at 1 kHz, obtained in the HP sample having a relatively smaller grain size of ∼2.4 μm, is assumed to be associated with a higher dielectric constant of thinner grain‐boundary phases. The low grain‐boundary resistivities of 199–319 kΩ·cm in the HP samples are likely induced by the N 2 atmosphere and less Cu‐rich grain‐boundary phase.