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Dielectric Properties of an Ultra‐Low‐Temperature Cofiring Bi 2 Mo 2 O 9 Multilayer
Author(s) -
Zhou Di,
Randall Clive A.,
Baker Amanda,
Wang Hong,
Pang LiXia,
Yao Xi
Publication year - 2010
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2010.03602.x
Subject(s) - materials science , ceramic , dielectric , ceramic capacitor , scanning electron microscope , electrode , composite material , cofiring , atmospheric temperature range , energy dispersive x ray spectroscopy , tape casting , analytical chemistry (journal) , capacitor , optoelectronics , electrical engineering , chemistry , physics , organic chemistry , chromatography , voltage , meteorology , combustion , engineering
A Bi 2 Mo 2 O 9 multilayer ceramic capacitor structure was fabricated in a thick‐film process involving tape casting and screen‐printing forming techniques. A novel base metal, Al, was used as the internal electrode, and these dielectrics were co‐sintered at 645°C in air. Scanning electron microscopy and energy dispersive spectroscopy (EDS) were used to investigate the local chemical compatibility between the electrode layer and ceramic layer, and no reaction or interdiffusion was found. Dielectric properties of electroded monolithic ceramic, multilayer, and monolayer samples at 100 Hz–10 MHz in a temperature range of −55°–+175°C were measured; values of the dielectric properties were similar to bulk measurements consistent with the absence of any interfacial reaction. Collectively, the data show that it is possible to use the low‐temperature firing Bi 2 Mo 2 O 9 ceramic and Al internal electrode for an ultra‐low‐temperature cofired ceramic technology.