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Direct Scanning Electron Microscopy Imaging of Ferroelectric Domains After Ion Milling
Author(s) -
Grüner Daniel,
Shen Zhijian
Publication year - 2010
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2009.03392.x
Subject(s) - scanning electron microscope , materials science , ferroelectricity , ion milling machine , ion , tilt (camera) , crystallography , resolution (logic) , analytical chemistry (journal) , nanotechnology , chemistry , optoelectronics , dielectric , composite material , geometry , mathematics , organic chemistry , layer (electronics) , artificial intelligence , computer science , chromatography
A method for directly observing the ferroelectric domain structure by scanning electron microscopy after argon ion milling has been established. Its advantages are exemplified by exposing the domain structure in three widely used ferroelectric ceramics, BaTiO 3 , (Na,K)NbO 3 , and Pb(Ti,Zr)O 3 . Stable high‐resolution images revealing domains with widths <30 nm have been obtained. The domain contrast is caused by electron channeling and is strongly dependent on the sample tilt angle. Owing to a strain‐ and defect‐free surface generated by gentle ion milling, pronounced orientation contrast is observed.