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Synthesis, Crystal Structure, and Microwave Dielectric Properties of (Mg 1− x Co x )Ta 2 O 6 Solid Solutions
Author(s) -
Huang ChengLiang,
Chen JhihYong
Publication year - 2010
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2009.03389.x
Subject(s) - solid solution , dielectric , analytical chemistry (journal) , crystal structure , materials science , ceramic , microwave , lattice constant , diffraction , dielectric loss , x ray crystallography , mineralogy , crystallography , chemistry , optics , metallurgy , physics , quantum mechanics , optoelectronics , chromatography
High‐dielectric‐constant and low‐loss ceramics in the (Mg 1− x Co x )Ta 2 O 6 solid solutions have been prepared using the conventional mixed oxide route and their microwave dielectric properties have been investigated. The X‐ray diffraction patterns as well as the measured lattice parameters indicated the (Mg 1− x Co x )Ta 2 O 6 ceramics tended to form a complete solid solution with a trirutile structure. In comparison with that of simple MgTa 2 O 6 , an enhanced grain growth can be achieved by substituting Mg with 0.05 mol% Co. It also leads to an increase in both the ɛ r and Q × f values of the ceramics. The specimen with x =0.05 possessed a combination of microwave dielectric properties: ɛ r ∼30.67, the Q × f ∼106 200 GHz, and τ f ∼42.9 ppm/°C.