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Microwave Dielectric Properties of SrRE 4 Si 3 O 13 (RE=La, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Er, Tm, Yb, and Y) Ceramics
Author(s) -
Thomas Sherin,
Sebastian Mailadil Thomas
Publication year - 2009
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2009.03326.x
Subject(s) - materials science , ceramic , analytical chemistry (journal) , scanning electron microscope , temperature coefficient , borosilicate glass , mineralogy , dielectric , permittivity , metallurgy , composite material , chemistry , optoelectronics , chromatography
The apatite type SrRE 4 Si 3 O 13 (RE=La, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Er, Tm, Yb, and Y) ceramics have been prepared by the conventional solid‐state ceramic route. The phase purity and surface morphology of the sintered ceramics were studied using X‐ray diffraction and scanning electron microscopy methods. These materials showed poor sinterability and was improved by the addition of a small weight percentage of zinc borosilicate glass. The microwave dielectric properties of these materials were studied for the first time. SrRE 4 Si 3 O 13 ceramics have a low relative permittivity (ɛ r ) in the range 9–16, a Q‐factor ( Q u × f ) upto 26 000 GHz and a low temperature coefficient of resonant frequency (τ f ). The SrLa 4 Si 3 O 13 ceramics possessed a high Q u × f of nearly 26 000 GHz but with a high negative τ f of −46 ppm/°C. The τ f of SrLa 4 Si 3 O 13 ceramics was tuned by the addition of suitable amount of TiO 2 .