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Dielectric and Piezoelectric Properties of PZT Composite Thick Films with Variable Solution to Powder Ratios
Author(s) -
Wu Dawei,
Zhou Qifa,
Shung Koping Kirk.,
Bharadwaja Srowthi N.,
Zhang Dongshe,
Zheng Haixing
Publication year - 2009
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2009.03065.x
Subject(s) - materials science , dielectric , piezoelectricity , composite material , composite number , polarization (electrochemistry) , piezoelectric coefficient , mineralogy , optoelectronics , chemistry
The use of PZT films in sliver‐mode high‐frequency ultrasonic transducers applications requires thick, dense, and crack‐free films with excellent piezoelectric and dielectric properties. In this work, PZT composite solutions were used to deposit PZT films >10 μm in thickness. It was found that the functional properties depend strongly on the mass ratio of PZT sol–gel solution to PZT powder in the composite solution. Both the remanent polarization, P r , and transverse piezoelectric coefficient, e 31, f , increase with increasing proportion of the sol–gel solution in the precursor. Films prepared using a solution‐to‐powder mass ratio of 0.5 have a remanent polarization of 8 μC/cm 2 , a dielectric constant of 450 (at 1 kHz), and e 31, f =−2.8 C/m 2 . Increasing the solution‐to‐powder mass ratio to 6, the films were found to have remanent polarizations as large as 37 μC/cm 2 , a dielectric constant of 1250 (at 1 kHz) and e 31, f =−5.8 C/m 2 .