Premium
Dielectric Properties of the Bi (1.6−0.8 x ) Y x Ti 2 O (6.4+0.3 x ) (0.03< x <2) Pyrochlore Solid Solution
Author(s) -
Kunej Špela,
Suvorov Danilo
Publication year - 2009
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2009.02995.x
Subject(s) - pyrochlore , dielectric , solid solution , analytical chemistry (journal) , materials science , scanning electron microscope , temperature coefficient , x ray crystallography , relaxation (psychology) , phase (matter) , diffraction , crystallography , chemistry , optics , physics , metallurgy , psychology , social psychology , optoelectronics , organic chemistry , chromatography , composite material
We have studied the dielectric properties of a new, cubic pyrochlore‐type solid solution Bi (1.6−0.8 x ) Y x Ti 2 O (6.4+0.3 x ) (0.03< x <2). The single‐phase nature of the pyrochlore solid solution was determined using X‐ray diffraction and scanning electron microscopy. We found that at room temperature and 1 MHz the pyrochlore solid solution exhibited values of the dielectric constant ɛ between 127 and 64, and low dielectric losses, tan δ, of <6 × 10 −3 . The temperature coefficient of the dielectric constant τ k is, however, strongly dependent on the composition. Below room temperature dielectric relaxation phenomena were observed for the compositions with low x values.