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Microwave Dielectric Properties of a New Ultra Low Loss Pervoskite Ceramic
Author(s) -
Tseng ChingFang
Publication year - 2008
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2008.02779.x
Subject(s) - microstructure , ceramic , materials science , scanning electron microscope , dielectric , mineralogy , microwave , analytical chemistry (journal) , dielectric loss , composite material , chemistry , physics , optoelectronics , quantum mechanics , chromatography
The microwave dielectric properties and microstructures of an Mg(Zr 0.05 Ti 0.95 )O 3 ceramic system have been investigated. The compounds were prepared by the conventional solid‐state route, and sintered at 1360°–1450°C for 2–6 h. The structure and microstructure were analyzed using X‐ray diffraction and scanning electron microscopy techniques. The Mg(Zr 0.05 Ti 0.95 )O 3 had excellent dielectric properties: Q × f =380 000 (GHz), ɛ r =18.1, and τ f =−50 ppm/°C for the sample at 1420°C/4 h. These properties were correlated with the formation of second phases, Mg 2 TiO 4 and Mg 0.25 Zr 0.38 Ti 0.38 O 1.75 .