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Misfit Dislocation Formation at the c / t Interphase Boundary in Y‐TZP
Author(s) -
Ii Seiichiro,
Yoshida Hidehiro,
Matsui Koji,
Ikuhara Yuichi
Publication year - 2008
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2008.02747.x
Subject(s) - interphase , yttrium , high resolution transmission electron microscopy , transmission electron microscopy , materials science , tetragonal crystal system , dislocation , crystallography , condensed matter physics , yttria stabilized zirconia , cubic zirconia , chemistry , composite material , nanotechnology , crystal structure , physics , ceramic , metallurgy , genetics , biology , oxide
The interphase boundary between the front of a cubic and tetragonal matrix grown in a yttria‐stabilized tetragonal zirconia polycrystal was investigated by conventional transmission electron microscopy (CTEM) and high‐resolution transmission electron microscopy (HRTEM). Periodic contrasts with a regular spacing were clearly observed on the boundary. CTEM and HRTEM observation revealed that there are misfit dislocations with a Burgers vector of 1/2〈110〉. The yttrium cation distribution across the interphase boundary was measured by energy‐dispersive X‐ray spectroscopy using a probe size <1 nm. The yttrium cation content changes sharply at the c/t interphase boundary with a transition width of about 10 nm.