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Extraction of Misorientation Components from the Total Misorientation at Grain Boundaries using Electron Diffraction in a Y 0.9 Sm 0.1 Ba 2 Cu 3 O 7 Film
Author(s) -
Li Jing,
Goyal Amit
Publication year - 2008
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2008.02558.x
Subject(s) - misorientation , materials science , grain boundary , superconductivity , epitaxy , electron diffraction , condensed matter physics , diffraction , crystallography , optics , chemistry , microstructure , metallurgy , physics , composite material , layer (electronics)
Grain boundary (GB) misorientation determines the transport properties of REBa 2 Cu 3 O 7 (REBCO) superconducting films (rare earth (RE)). In this study, the misorientation angles between the adjacent grains in a Y 0.9 Sm 0.1 Ba 2 Cu 3 O 7 (YSBCO) epitaxial superconducting film on buffers performed via ion‐beam‐assisted deposition have been characterized using transmission electron microscopy. The in‐plane and out‐of‐plane misorientation at GBs and sub‐GBs has been separated from the total misorientation. Most of the GB misorientation angles are smaller than 5°, with the in‐plane component γ<3° and out‐of‐plane components α≤1° and β<2°. This study provided a relatively simplified, practical, and useful method for determination of GB misorientation angles and separation of the in‐plane and out‐of‐plane misorientation from the total misorientation for epitaxial REBCO superconducting films.