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Dielectric and Structural Properties of Layer‐Structured Sr 1− x Ca x Bi 2 Nb 2 O 9
Author(s) -
Huang Shiming,
Li Yuchen,
Feng Chude,
Gu Mu,
Liu Xiaolin
Publication year - 2008
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2008.02554.x
Subject(s) - dielectric , raman spectroscopy , analytical chemistry (journal) , ferroelectricity , materials science , octahedron , x ray crystallography , crystallography , phase (matter) , phase transition , permittivity , mineralogy , diffraction , crystal structure , chemistry , condensed matter physics , optics , physics , optoelectronics , organic chemistry , chromatography
Sr 1− x Ca x Bi 2 Nb 2 O 9 ( x =0, 0.2, 0.4, 0.6, 0.8 and 1) ceramics were prepared by a conventional solid‐state reaction method. Their dielectric and structural properties were investigated. X‐ray diffraction analysis indicated that single‐phase layered perovskites were obtained. For Ca‐substituted specimens, a dielectric relaxation peak is observed in the temperature range of 30°–150°C, and there is a broader para‐ferroelectric phase transition peak. The temperature of the maximum dielectric constant T m increases linearly with increasing Ca content. Raman spectra indicate that a small amount of Ca 2+ is incorporated into Bi sites in the Bi 2 O 2 layers, and an increase in the degree of distortion of NbO 6 octahedra for Ca‐substituted specimens should be one of the reasons for the increase in T m compared with SrBi 2 Nb 2 O 9 .