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Hydrogen‐Induced Failure in ZnO Multilayer Ceramic Chip Varistors with a Zinc Phosphate Passivation Layer
Author(s) -
Chen Wan Ping,
Zhu Kan,
Wang Yu,
Chan Helen L. W.,
Wu Jun,
Ye Chang He
Publication year - 2008
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2008.02378.x
Subject(s) - passivation , materials science , zinc , electrochemistry , ceramic , layer (electronics) , hydrogen , zinc phosphate , electrolysis of water , electrolysis , varistor , chemical engineering , oxide , inorganic chemistry , metallurgy , electrode , composite material , chemistry , electrolyte , organic chemistry , voltage , engineering , physics , quantum mechanics
Zinc oxide multilayer ceramic chip varistors (MLVs) with a zinc phosphate passivation layer were studied using electrochemical hydrogen charging, in which hydrogen was deposited on the termination electrodes of MLVs through the electrolysis of water in 0.01 m NaOH solution. The properties of the MLVs remained stable during the first stage of electrochemical hydrogen charging, except that the capacitance was increased slightly. Then a second stage appeared in which the properties of the MLVs were quickly and greatly degraded. The zinc phosphate passivation layer was found to be responsible for producing the first stable stage of electrochemical hydrogen charging. A passivation layer is of great importance to prevent hydrogen‐induced failure for MLVs in service.