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Phase Evolution in Heat‐Treated Si 3 N 4 with Additions of Yb 2 O 3
Author(s) -
Guo Gang Feng,
Li Jianbao,
Kong Xiang Yang,
Lin Hong,
Liang Long,
He Mingsheng,
Yang Liu,
Wu Jiang,
Cui Bai
Publication year - 2008
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2007.02119.x
Subject(s) - crystallization , materials science , analytical chemistry (journal) , phase (matter) , ceramic , silicon nitride , transmission electron microscopy , nitride , silicon , crystallography , mineralogy , chemical engineering , metallurgy , chemistry , nanotechnology , organic chemistry , chromatography , engineering , layer (electronics)
The heat treatment of silicon nitride (Si 3 N 4 ) ceramics with additions of 8, 12, and 16 wt% Yb 2 O 3 was carried out at different temperatures and the evolution of grain boundary (GB) phase was investigated systematically by X‐ray diffraction (XRD) as well as scanning electron and transmission electron microscopic analyses. XRD results reveal that the extent and the ease of GB crystallization increase with increasing the Yb 2 O 3 content, and that high heat‐treatment temperatures in general favor crystallization of the quaternary compounds such as the Yb 4 Si 2 O 7 N 2 phase. These results provide an insight into the GB phase evolution in the Yb‐system Si 3 N 4 ceramics subjected to a postsintering heat treatment.