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Effect of Zn/Si Ratio on the Microstructural and Microwave Dielectric Properties of Zn 2 SiO 4 Ceramics
Author(s) -
Nguyen NgocHuan,
Lim JongBong,
Nahm Sahn,
Paik JongHoo,
Kim JongHee
Publication year - 2007
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2007.01891.x
Subject(s) - ceramic , materials science , grain size , dielectric , microwave , phase (matter) , zinc , analytical chemistry (journal) , microstructure , mineralogy , metallurgy , chemistry , optoelectronics , physics , organic chemistry , chromatography , quantum mechanics
Zn 2 SiO 4 ceramics synthesized by the conventional solid‐state method exhibited a low Q × f value, possibly due to the formation of a ZnO second phase. However, with a small ZnO reduction from the Zn 2 SiO 4 ceramics, the ZnO second phase disappeared and grain growth occurred due to the formation of a Si‐rich liquid phase. Specimens with a large grain size exhibited an improved Q × f value. In particular, the ceramics with nominal composition Zn 1.8 SiO 3.8 sintered at 1300°C exhibited improved microwave dielectric properties of ɛ r =6.6, Q × f =147 000 GHz, and τ f =−22 ppm/°C.