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X‐Ray Diffraction and Raman Spectroscopic Investigation on the Phase Relations in Yb 2 O 3 ‐ and Tm 2 O 3 ‐Substituted CeO 2
Author(s) -
Mandal Balaji Prasad,
Grover Vinita,
Roy Mainak,
Tyagi Avesh Kumar
Publication year - 2007
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2007.01826.x
Subject(s) - raman spectroscopy , crystallography , diffraction , x ray crystallography , solid solution , lattice (music) , materials science , analytical chemistry (journal) , doping , chemistry , physics , optics , chromatography , optoelectronics , acoustics , metallurgy
Powder X‐ray diffraction (XRD) and Raman spectroscopic studies on Ce 1− x Yb x O 2− x /2 and Ce 1− x Tm x O 2− x /2 (0.0≤ x ≤1.0) are being reported in this manuscript. It has been observed that ceria when heavily doped with ytterbia and thulia get transformed from single‐phasic F type to single‐phasic C type through the formation of a biphasic mixture. The critical concentrations at which the phase transition takes place have also been ascertained from XRD measurements and verified using Raman spectroscopy. From XRD studies, it has been found that in the case of Ce 1− x Yb x O 2− x /2 , pure F‐type lattice continues until x =0.4 and then the biphasic region comprising F‐type and C‐type solid solutions starts, which is followed by single‐phasic pure C‐type region above x =0.9. For Ce 1− x Tm x O 2− x /2 , XRD studies reveal that the biphasic region comprising C‐type and F‐type lattice is formed from x =0.5 onward. However, it has been confirmed from Raman spectroscopic studies that the C‐type lattice is formed even in the sample at x =0.4. The discrepancy is believed to have originated because of the small domain size (smaller than the coherence length of X‐rays) of the C‐type lattice that are inhomogeneously distributed within the F‐type solid solution in the composition Ce 1− x Tm x O 2− x /2 ( x =0.4), which could not be directly detected from XRD measurements.