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Microstructure, Density, and Dielectric Properties of Lead‐Free (K 0.44 Na 0.52 Li 0.04 )(Nb 0.96− x Ta x Sb 0.04 )O 3 Piezoelectric Ceramics
Author(s) -
Chang Yunfei,
Yang Zupei,
Wei Lingling
Publication year - 2007
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2007.01631.x
Subject(s) - materials science , dielectric , piezoelectricity , ceramic , microstructure , orthorhombic crystal system , tetragonal crystal system , sintering , relative density , analytical chemistry (journal) , mineralogy , grain size , poling , grain growth , composite material , crystallography , crystal structure , ferroelectricity , optoelectronics , chemistry , chromatography
Lead‐free (K 0.44 Na 0.52 Li 0.04 ) (Nb 0.96−x Ta x Sb 0.04 )O 3 piezoelectric ceramics were prepared by the conventional solid‐state sintering method. The grain growth of the ceramics was inhibited and the relative density was improved with Ta substituting for Nb. Increasing x led to different variations of dielectric properties before and after poling, and prevented the occurrence of orthorhombic–tetragonal phase transition (at T o − t ). All the ceramics show an intermediate relaxor‐like behavior between normal and ideal relaxor ferroelectrics. Significantly enhanced dielectric and piezoelectric properties were obtained in the ceramics with x =0.20. The ceramics are very promising lead‐free materials for electromechanical device applications.