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Dielectric Relaxation in Layer‐Structured SrBi 2− x Nd x Nb 2 O 9 Ceramics ( x =0, 0.05, 0.2, 0.35)
Author(s) -
Sun Lin,
Feng Chude,
Chen Lidong,
Huang Shiming
Publication year - 2007
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2006.01405.x
Subject(s) - materials science , dielectric , ceramic , analytical chemistry (journal) , dispersion (optics) , mineralogy , sintering , relaxation (psychology) , doping , phase (matter) , chemistry , optics , metallurgy , physics , psychology , social psychology , optoelectronics , organic chemistry , chromatography
SrBi 2− x Nd x Nb 2 O 9 ( x =0, 0.05, 0.2, 0.35) ceramics were synthesized by the traditional solid‐state sintering method. X‐ray diffraction analysis showed that single‐phase‐layered perovskites were obtained for all compositions. The substitution of Nd 3+ for Bi 3+ induced a relaxor behavior of frequency dispersion for Nd‐doped SrBi 2 Nb 2 O 9 .The parameter of frequency dispersion Δ T m , which is the T m between 1 kHz and 1 MHz, increases from 0°C for x =0 to 13°C for x =0.35, and the degree of relaxor behavior γ increases from 0.96 for x =0 to 2.02 for x =0.35. The temperature of the maximum dielectric constant T m decreases linearly with an increase in the Nd content ( x ).
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