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Peculiar Dielectric Behaviors of (Na 1/2 Bi 1/2 ) 0.87 Pb 0.13 TiO 3 Thin Films
Author(s) -
Zhou Z. H.,
Wang J.
Publication year - 2007
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2006.01340.x
Subject(s) - dielectric , materials science , bismuth , nanoclusters , thin film , permittivity , dielectric loss , bismuth titanate , perovskite (structure) , titanate , mineralogy , analytical chemistry (journal) , dispersion (optics) , dielectric permittivity , condensed matter physics , ferroelectricity , ceramic , crystallography , nanotechnology , composite material , chemistry , optics , optoelectronics , physics , metallurgy , chromatography
PbTiO 3 ‐doped sodium bismuth titanate (Na 1/2 Bi 1/2 ) 1− x Pb x TiO 3 of perovskite structure is one of the best‐known piezoelectrics/ferroelectrics. However, it has not been properly investigated in any thin‐film forms. In this study, the dielectric properties of (Na 1/2 Bi 1/2 ) 0.87 Pb 0.13 TiO 3 thin films synthesized via a sol–gel route were investigated. They exhibit a strong frequency dispersion of the dielectric permittivity at relatively high frequencies, which is shifted to lower frequencies with increasing temperature. The electrical behavior can be fitted using Jonscher's universal law for dielectric relaxation. The peculiar dielectric behaviors observed can be ascribed to the coexistence of two different dielectric phases in the films, which is believed to be associated with the growth of the local Pb 2+ TiO 3 nanoclusters upon substitution of Pb 2+ for Na + /Bi 3+ in the (Na 1/2 Bi 1/2 ) 1− x Pb x TiO 3 films.