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PLZT Phases Near Lead Zirconate: 2. Determination by Capacitance and Polarization
Author(s) -
Breval Else,
Wang Chiping,
Dougherty Joseph P.,
Yilmazbayhan Aylin,
Gachigi Kamau W. A.,
Stewart Michael,
Duva Frank,
Crespi Ann
Publication year - 2006
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2006.01320.x
Subject(s) - capacitance , materials science , orthorhombic crystal system , polarization (electrochemistry) , phase diagram , electric field , analytical chemistry (journal) , diffraction , ferroelectricity , hexagonal crystal system , condensed matter physics , hexagonal phase , phase (matter) , mineralogy , dielectric , chemistry , optics , crystallography , electrode , optoelectronics , physics , organic chemistry , quantum mechanics , chromatography
The phases of PLZT, (Pb,La)(Zr,Ti)O 3 , or L / Z / T for L <12 and T <10 were detected via determination of capacitance at varying temperatures at 0 field and via polarization at varying fields at room temperature and at selected elevated temperatures. It was possible to determine two different orthorhombic phases, and three rhombohedral (hexagonal) phases, one of which only exists at elevated temperatures. Two sets of phase diagrams were constructed with the phases as a function of temperature, and electric field, respectively. Temperature/field phase diagrams for 0/100/0, 2.95/5, and 4/95/5 were also constructed. A comparison was made between room‐temperature and 0 field PLZT phase diagrams determined via X‐ray diffraction, capacitance, and polarization.