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Development of an Open‐Ended Coaxial Line Probe for Measurement of Dielectric Properties of Inorganic Materials at High Temperature
Author(s) -
Uematsu Kazuyoshi,
Tsuchida Jyunji,
Sato Mineo,
Toda Kenji
Publication year - 2006
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2006.01074.x
Subject(s) - materials science , dielectric , coaxial , microwave , network analyzer (electrical) , insulator (electricity) , quartz , temperature measurement , composite material , electrical conductor , analytical chemistry (journal) , optoelectronics , electronic engineering , electrical engineering , chemistry , physics , chromatography , quantum mechanics , engineering
An open‐ended coaxial line probe for dielectric measurements at high temperatures was developed. The probe, which was fabricated using stainless steel as the center and outer conductors and quartz wool as an insulator, can function well up to 800°C. The dielectric properties of the raw materials and resultant materials were measured using a network analyzer that was equipped with the open‐ended coaxial line probe at high temperatures to clarify the formation reaction process of YVO 4 :Eu 3+ and Mg 2 SnO 4 :Mn 2+ phosphors using a microwave heating method. The developed probe was confirmed to be effective for reaction‐process analyses at high temperatures.