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Variable Dielectrics in the Calcium Magnesium Titanate System Characterized with Scanning Microwave Microscopy
Author(s) -
Wing Zachary N.,
Halloran John W.,
Zhang Qinxin,
McGinn Paul J.
Publication year - 2006
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2006.00962.x
Subject(s) - dielectric , microwave , materials science , microscopy , permittivity , relative permittivity , scanning electron microscope , phase (matter) , mineralogy , analytical chemistry (journal) , optics , optoelectronics , composite material , chemistry , physics , quantum mechanics , organic chemistry , chromatography
Near‐field scanning microwave microscopy (SMM) is used to observe the fine‐scale dielectric phenomena. The purpose of the present study is to apply the SMM to examine the dielectrics in the multiphase CT–MT–M 2 T system and study the dielectric relative permittivitydistribution. SMM clearly resolves the three‐phase distribution and is in agreement with chemical analysis.