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Dielectric and Electrical Conductivity Properties of PMS–PZT Ceramics
Author(s) -
Zhu Zhigang,
Zheng Naizhan,
Li Guorong,
Yin Qingrui
Publication year - 2006
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2005.00750.x
Subject(s) - materials science , dielectric , electrical resistivity and conductivity , annealing (glass) , conductivity , analytical chemistry (journal) , ceramic , dielectric loss , doping , oxygen , diffraction , perovskite (structure) , mineralogy , composite material , chemistry , crystallography , optoelectronics , optics , electrical engineering , chromatography , engineering , physics , organic chemistry
The dielectric and electrical conductivity properties of x Pb(Mn 1/3 Sb 2/3 )O 3 –(1− x )Pb(Zr 0.52 Ti 0.48 )O 3 (PMS–PZT) ceramics were studied. X‐ray diffraction indicated that all samples exhibit a single‐phase perovskite structure. Dielectric study revealed that the dielectric relaxor behavior was induced by co‐doping Mn 2+ and Sb 5+ into Pb(Zr 0.52 Ti 0.48 )O 3 ceramics. Electrical conductivity measurements showed that the concentration of carriers are increased with the increase in PMS contents. After annealing in an oxygen atmosphere for 30 h, the direct current conductivity of PMSZ15 was much lower than that of the as‐sintered sample. The reason why this phenomenon occurs may be the reduction of oxygen‐vacancy concentration.