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Relaxor Behavior of Sr 1– x Ba x Bi 2 Nb 2 O 9 Ceramics
Author(s) -
Huang Shiming,
Feng Chude,
Chen Lidong,
Wang Qun
Publication year - 2006
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2005.00662.x
Subject(s) - analytical chemistry (journal) , materials science , dielectric , ceramic , x ray crystallography , solid solution , mineralogy , diffraction , crystallography , chemistry , physics , metallurgy , optics , chromatography , optoelectronics
Sr 1− x Ba x Bi 2 Nb 2 O 9 ( x =0, 0.2, 0.4, 0.6, 0.8 and 1) ceramics were prepared by a conventional solid‐state reaction method. Their structure and dielectric properties were investigated. X‐ray diffraction analysis indicated that single‐phase layered perovskites were obtained. A relaxor behavior was observed in Ba‐substituted SrBi 2 Nb 2 O 9 . The temperature of the maximum dielectric constant T m decreases linearly with increasing Ba content ( x ) up to x =0.6, and only a little decrease in T m is observed when 0.6< x <0.8. However, there is a little increase in T m when 0.8< x ≤1.0. The degree of frequency dispersion Δ T m , which is the T m difference between 1 kHz and 1 MHz, increases from 0°C for x =0 to 110°C for x =1.