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Local Phenomena in Oxides by Advanced Scanning Probe Microscopy
Author(s) -
Kalinin Sergei V.,
Shao Rui,
Bonnell Dawn A.
Publication year - 2005
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2005.00383.x
Subject(s) - characterization (materials science) , scanning probe microscopy , nanotechnology , materials science , grain boundary , nanometre , ferroelectricity , engineering physics , optoelectronics , microstructure , physics , metallurgy , dielectric , composite material
In the last two decades, scanning probe microscopies (SPMs) have become the primary tool for addressing structure and electronic, mechanical, optical, and transport phenomena on the nanometer and atomic scales. Here, we summarize basic principles of SPM as applied for oxide materials characterization and present recent advances in high‐resolution imaging and local property measurements. The use of advanced SPM techniques for solutions of material related problems is illustrated on the examples of grain boundary transport in polycrystalline oxides and ferroelectric domain imaging and manipulation. Future prospects for SPM applications in materials science are discussed.