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In Situ Measurement of Capacitance: A Method for Fabricating Nanoglass
Author(s) -
Ohta Y.,
Kitayama M.,
Kaneko K.,
Toh S.,
Shimizu F.,
Morinaga K.
Publication year - 2005
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2005.00257.x
Subject(s) - capacitance , crystallite , materials science , transmission electron microscopy , in situ , diffraction , composite material , analytical chemistry (journal) , optics , electrode , nanotechnology , chemistry , metallurgy , physics , organic chemistry , chromatography
The capacitance of the Na 2 O–SiO 2 glass was measured in situ during heat treatment at various frequencies, 20, 100, 1, 3, 10, and 30 kHz. It was found that the capacitance of the glass abruptly decreases after a certain duration. The glass was quenched at this stage. It was confirmed by the X‐ray diffraction and transmission electron microscopy that this decrease of capacitance was associated with the formation of crystallites in the glass matrix. The size of crystallites was observed to be in the range of about 10 nm.