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Tricalcium Silicate T 1 and T 2 Polymorphic Investigations: Rietveld Refinement at Various Temperatures Using Synchrotron Powder Diffraction
Author(s) -
Peterson Vanessa K.,
Hunter Brett A.,
Ray Abhi
Publication year - 2004
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2004.01625.x
Subject(s) - rietveld refinement , powder diffraction , triclinic crystal system , synchrotron , materials science , crystallography , crystal structure , x ray crystallography , silicate , superstructure , diffraction , differential thermal analysis , atmospheric temperature range , lattice constant , polymorphism (computer science) , analytical chemistry (journal) , chemistry , thermodynamics , optics , biochemistry , physics , organic chemistry , chromatography , gene , genotype
The lattice parameters, cell volume, and structure of a sample of phase pure triclinic tricalcium silicate were determined using in situ, high‐temperature synchrotron powder diffraction and full‐profile Rietveld refinement. The temperature range covered was from ambient to 740°C. Evidence of superstructure was found. The T 2 type structure with disordered SiO 4 tetrahedra was observed, and an average structure for the subcell ( P , a = 11.7416(2) Å, b = 14.2785(2) Å, c = 13.7732(2) Å, α= 105.129(1)°, β= 94.415(1)°, and γ= 89.889(1)°) is presented. Differential thermal analysis and X‐ray fluorescence was also performed.