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X‐ray Diffraction Methodology for the Microstructural Analysis of Nanocrystalline Powders: Application to Cerium Oxide
Author(s) -
Leoni Matteo,
Maggio Rosa,
Polizzi Stefano,
Scardi Paolo
Publication year - 2004
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2004.01133.x
Subject(s) - nanocrystalline material , materials science , transmission electron microscopy , calcination , diffraction , cerium oxide , microstructure , x ray crystallography , complex oxide , cerium , oxide , nanocrystal , powder diffraction , mineralogy , crystallography , chemical engineering , metallurgy , nanotechnology , optics , chemistry , biochemistry , physics , engineering , catalysis
The microstructural evolution of nanocrystalline ceria produced by sol–gel has been analyzed as a function of the calcination temperature employing a novel nondestructive method based on the modeling of the whole X‐ray diffraction pattern. The results have been thoroughly verified by transmission electron microscopy. A variation both in the average size and in the distribution of the crystalline domains is evidenced. In addition, information concerning lattice defects can be inferred on a larger scale than that normally accessible by microscopy techniques.