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Effect of Electrode Configuration on Phase Retardation of PLZT Films Grown on Glass Substrate
Author(s) -
Choi JongJin,
Kim DalYoung,
Park GunTae,
Kim HyounEe
Publication year - 2004
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2004.00950.x
Subject(s) - materials science , electrode , lead zirconate titanate , substrate (aquarium) , phase (matter) , composite material , ferroelectricity , lanthanum , thin film , optoelectronics , dielectric , nanotechnology , inorganic chemistry , chemistry , oceanography , organic chemistry , geology
Lead lanthanum zirconate titanate (PLZT) thick films were deposited on a glass substrate using a methoxyethanol‐based sol–gel multicoating method. Two types of electrodes, a coplanar surface electrode and an embedded electrode, were deposited on the films to measure the phase retardation of the PLZT films by the Senarmont method. The quadratic electrooptic properties were measured as a function of the film thickness, for thicknesses ranging from 1 to 4 μm. The PLZT film with the embedded electrode structure showed a higher phase retardation value and enhanced electric breakdown resistance.