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Characterization of Nanodomains in Polymer‐Derived SiCN Ceramics Employing Multiple Techniques
Author(s) -
Saha A.,
Raj R.,
Williamson D. L.,
Kleebe H.J.
Publication year - 2005
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2004.00034.x
Subject(s) - small angle x ray scattering , materials science , crystallite , characterization (materials science) , ceramic , nanoclusters , cubic zirconia , transmission electron microscopy , nanocomposite , polymer , scattering , chemical engineering , nanotechnology , composite material , optics , metallurgy , physics , engineering
A combination of methods, Bragg diffraction, small‐angle X‐ray scattering (SAXS), and transmission electron microscopy, is applied to the characterization of nanodomains and nanocrystals in polymer‐derived ceramics (PDCs). Detailed study of two materials, silicon carbonitride (SiCN) and a SiCN–zirconia nanocomposite, is presented. The first contains domains which can be measured only by SAXS. However, the nanocrystallites of zirconia in the second material can be quantatively studied by all three techniques. In both instances, we find the SAXS to be particularly useful because these data provide detailed information regarding the size distribution of the domains and the crystallites. This information can be valuable in understanding the materials science of PDCs: e,g., the change in the distribution and the average size of the nanoclusters can be modeled to understand the kinetic mechanisms of coarsening at high temperatures.