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Goodness‐of‐Fit Diagnostics for Bayesian Hierarchical Models
Author(s) -
Yuan Ying,
Johnson Valen E.
Publication year - 2012
Publication title -
biometrics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.298
H-Index - 130
eISSN - 1541-0420
pISSN - 0006-341X
DOI - 10.1111/j.1541-0420.2011.01668.x
Subject(s) - goodness of fit , bayesian probability , bayesian hierarchical modeling , statistics , econometrics , computer science , mathematics , bayesian inference , artificial intelligence
Summary This article proposes methodology for assessing goodness of fit in Bayesian hierarchical models. The methodology is based on comparing values of pivotal discrepancy measures (PDMs), computed using parameter values drawn from the posterior distribution, to known reference distributions. Because the resulting diagnostics can be calculated from standard output of Markov chain Monte Carlo algorithms, their computational costs are minimal. Several simulation studies are provided, each of which suggests that diagnostics based on PDMs have higher statistical power than comparable posterior‐predictive diagnostic checks in detecting model departures. The proposed methodology is illustrated in a clinical application; an application to discrete data is described in supplementary material.

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