Premium
Multistage Evaluation of Measurement Error in a Reliability Study
Author(s) -
Liu Aiyi,
Schisterman Enrique F.,
Wu Chengqing
Publication year - 2006
Publication title -
biometrics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.298
H-Index - 130
eISSN - 1541-0420
pISSN - 0006-341X
DOI - 10.1111/j.1541-0420.2006.00572.x
Subject(s) - reliability (semiconductor) , reliability engineering , computer science , observational error , statistics , mathematics , engineering , power (physics) , physics , quantum mechanics
Summary We introduce sequential testing procedures for the planning and analysis of reliability studies to assess an exposure's measurement error. The designs allow repeated evaluation of reliability of the measurements and stop testing if early evidence shows the measurement error is within the level of tolerance. Methods are developed and critical values tabulated for a number of two‐stage designs. The methods are exemplified using an example evaluating the reliability of biomarkers associated with oxidative stress.