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RELIABILITY AND VALIDITY OF THE ABBREVIATED MENTAL TEST (HONG KONG VERSION) IN RESIDENTIAL CARE HOMES
Author(s) -
Lam Simon C.,
Wong Yuetying,
Woo Jean
Publication year - 2010
Publication title -
journal of the american geriatrics society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.992
H-Index - 232
eISSN - 1532-5415
pISSN - 0002-8614
DOI - 10.1111/j.1532-5415.2010.03129.x
Subject(s) - test (biology) , medicine , dementia , cognition , gerontology , reliability (semiconductor) , construct validity , psychometrics , clinical psychology , psychiatry , paleontology , power (physics) , physics , pathology , quantum mechanics , biology , disease