z-logo
Premium
Sample preparation effects on illite crystallinity measurement: grain‐size gradation and particle orientation
Author(s) -
KRUMM S.,
BUGGISCH W.
Publication year - 1991
Publication title -
journal of metamorphic geology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.639
H-Index - 114
eISSN - 1525-1314
pISSN - 0263-4929
DOI - 10.1111/j.1525-1314.1991.tb00557.x
Subject(s) - platy , gradation , crystallinity , materials science , grain size , crystallite , mineralogy , plateau (mathematics) , particle size , composite material , diffraction , particle (ecology) , intensity (physics) , illite , geology , optics , metallurgy , mathematical analysis , paleontology , oceanography , physics , mathematics , quartz , computer science , computer vision
Specimen thickness is the main experimental factor controlling the results of illite crystallinity (IC) or crystallite size measurements on sedimentation slides. Different values obtained from thick and thin preparations are due to grain‐size gradation effects, which may exclude larger and higher ordered grains from contributing to the diffraction. Orientation effects control the measured peak intensity. The change from poor particle orientation in thick slides to high orientation in very thin slides is marked by an increase in specimen density, diminishing non‐basal reflections, and by a strong increase in peak intensity. A plateau with constant peak breadths is observed if thin slides of well ordered, platy illites are used. A similar plateau can be recognized for thick preparations of specimens from less ordered materials, but not from well ordered ones. Therefore, it is suggested that IC is determined on very thin sedimentation slides with a thickness of 0.25 mg/cm 2 or less. Ultrasonic and H 2 O 2 treatments enhance the degree of particle orientation by destruction of grain aggregates and organic compounds, leading to smaller peak breadths and higher intensities.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here