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Measurement and Analysis of Object Reflectance Spectra
Author(s) -
Vrhel Michael J.,
Gershon Ron,
Iwan Lawrence S.
Publication year - 1994
Publication title -
color research and application
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.393
H-Index - 62
eISSN - 1520-6378
pISSN - 0361-2317
DOI - 10.1111/j.1520-6378.1994.tb00053.x
Subject(s) - principal component analysis , reflectivity , range (aeronautics) , set (abstract data type) , basis (linear algebra) , object (grammar) , computer science , remote sensing , data set , field (mathematics) , optics , mathematics , artificial intelligence , biological system , pattern recognition (psychology) , materials science , physics , geometry , geology , pure mathematics , composite material , programming language , biology
Recent algorithms developed in the field of color vision make assumptions based on the spectral reflectance curves of Munsell chips and natural materials. Some of them rely on data collected many years ago. which is partially incomplete in the visible spectrum. or contains many occurrences of the same material in it. In this article. we present a set of new measurements of different materials. In particular. we measured the spectral reflectance of Munsell chips, paints. and various natural materials in the 390–730‐nm range. In addition, we have analyzed. through principal‐component analysis, the possibility of representing the data collected with a set of basis functions. We show the implications of varying the number of principal components used (from 7 down to 3) on the errors introduced using this method.