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An Electron Microscope Study of Wools Subjected to some Shrink‐resist Processes
Author(s) -
Blakey P. R.,
Perfitt W.
Publication year - 1969
Publication title -
journal of the society of dyers and colourists
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.297
H-Index - 49
eISSN - 1478-4408
pISSN - 0037-9859
DOI - 10.1111/j.1478-4408.1969.tb02887.x
Subject(s) - wool , electron microscope , resist , materials science , composite material , scanning electron microscope , membrane , chemistry , optics , physics , layer (electronics) , biochemistry
The Dylan process and the Wurlan process were used to produce shrink‐resistant wools. The effects of the two processes on the structure of wool were compared using the electron microscope. The Dylan treatment causes chemical degradation of the cuticle and cell membranes, which are therefore more easily deformed. Transverse sections of Wurlanised wool appear to be unmodified internally, and the nylon film varies in thickness from ca 500 Å on the surface of the wool scales to ca 5500 Å at the scale edges, giving almost complete scale masking.