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Rough days in democracies: Comparing protests in democracies
Author(s) -
NAM TAEHYUN
Publication year - 2007
Publication title -
european journal of political research
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.267
H-Index - 95
eISSN - 1475-6765
pISSN - 0304-4130
DOI - 10.1111/j.1475-6765.2006.00645.x
Subject(s) - democracy , legislature , argument (complex analysis) , institution , government (linguistics) , variation (astronomy) , political science , diversity (politics) , political economy , politics , coercion (linguistics) , representative democracy , public administration , sociology , law , biochemistry , chemistry , linguistics , philosophy , physics , astrophysics
. Democratic political institutions are generally designed to channel public opinion; yet citizens often take to the streets in protest. Why would citizens, provided with formal mechanisms to affect the policy process, resort to extraordinary means? This article argues that the strength of representative institutions influences the likelihood of protest. The democratic institution literature does not address the issue of protest and in the protest literature effects of the democratic governmental structure have been largely underestimated. However, the diversity in government formats across democratic states and the corresponding variation in amount of protests leads one to question the relationship between them. This article identifies the variation in the scale of protests among democratic regimes in Western European countries using the European Protest and Coercion Data and explains protest using variation in the forms of government. Protesters in democratic countries with a weak legislature find it difficult to deliver their demands to government due to the institutional environment. Therefore, they are more inclined to protest than citizens in countries with a strong legislature. This argument is tested along with other structural variables and supported by results from testing models using ordinary least squares with panel‐corrected standard errors.