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THE APPLICATION OF TIME‐OF‐FLIGHT SECONDARY ION MASS SPECTROMETRY (ToF‐SIMS) TO THE CHARACTERIZATION OF OPAQUE ANCIENT GLASSES*
Author(s) -
RUTTEN F. J. M.,
BRIGGS D.,
HENDERSON J.,
ROE M. J.
Publication year - 2009
Publication title -
archaeometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.716
H-Index - 67
eISSN - 1475-4754
pISSN - 0003-813X
DOI - 10.1111/j.1475-4754.2008.00445.x
Subject(s) - opacity , secondary ion mass spectrometry , time of flight , characterization (materials science) , mass spectrometry , analytical chemistry (journal) , matrix (chemical analysis) , materials science , time of flight mass spectrometry , ion , chemistry , mineralogy , nanotechnology , optics , chromatography , physics , organic chemistry , ionization
Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) has been used, for the first time, for the characterization of opaque ancient glasses. Isotope‐specific chemical imaging with sub‐micron resolution enabled the separate analysis of opacifiying inclusions and the surrounding glass matrix. Phase identification has been demonstrated and quantification of the matrix composition has been investigated by use of Corning Glass Standard B as a model. Trace element detection limits are typically in the range 0.5–5.0 ppm atomic—in favourable cases down to 0.01 ppm. For the analysis of inclusions in particular, this has the potential to provide new information of use in establishing provenance and trade routes by ‘fingerprinting’ as well as the investigation of manufacturing techniques, as demonstrated by comparisons between glasses and with EDX data from the same samples.