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Characterisation of Indentation‐Induced Pattern Using Full‐Field Strain Measurement
Author(s) -
Kuo J.C.,
Tung S.H.,
Shih M.H.,
Lu Y.Y.
Publication year - 2010
Publication title -
strain
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.477
H-Index - 47
eISSN - 1475-1305
pISSN - 0039-2103
DOI - 10.1111/j.1475-1305.2008.00576.x
Subject(s) - indentation , digital image correlation , materials science , distortion (music) , plane stress , von mises yield criterion , strain (injury) , composite material , aluminium , structural engineering , finite element method , engineering , medicine , amplifier , optoelectronics , cmos
In this study, digital image correlation (DIC)‐based strain analysis software was successfully developed. Its strain resolution lies in the order of 2.3 × 10 −4 –3.1 × 10 −4 . Full‐strain field measurement was used to study indentation‐induced plastic patterns around the spherical indenter for a polycrystal and a single crystal of pure aluminium. During indentation, the pure aluminium specimen of the single crystal revealed a symmetric indentation pattern of von Mises strain. The piling‐up around the residual impression was successfully and directly characterised by examining the sign of strain ɛ X and ɛ Y in the X and Y directions. However, the inward, out‐of‐plane movement results in an error in calculating in‐plane strain referred to as a ‘distortion strain’ using two‐dimensional DIC.