Premium
Experimental Mechanics at the Nanometric Level
Author(s) -
Sciammarella C. A.
Publication year - 2008
Publication title -
strain
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.477
H-Index - 47
eISSN - 1475-1305
pISSN - 0039-2103
DOI - 10.1111/j.1475-1305.2008.00393.x
Subject(s) - optical microscope , optics , microscope , rayleigh scattering , materials science , resolution (logic) , microscopy , field (mathematics) , electron microscope , polystyrene , nanotechnology , physics , scanning electron microscope , polymer , computer science , composite material , mathematics , artificial intelligence , pure mathematics
This article describes research carried out in the field of optical super‐resolution. The main goal of this study was to go beyond the Rayleigh limit in conventional optics and observe phenomena at the nano‐range, because in certain circumstances methods such as X‐ray and electron microscopy cannot be applied because of their influence on the observed specimens. In summary, the presence of a small polystyrene sphere on the optical field of a conventional optical microscope seems to have converted the microscope into a device capable of functioning beyond the classical limit of resolution. This means that the near‐field generated by evanescent illumination can be sensed by a microscope. Detection of particles in the range of a few tens of nanometres was achieved.