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The Geometric Contribution to Gauge Factor of Patterned Lines on Substrates
Author(s) -
Gouldstone C.,
Wu Y.,
Gouldstone A.
Publication year - 2007
Publication title -
strain
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.477
H-Index - 47
eISSN - 1475-1305
pISSN - 0039-2103
DOI - 10.1111/j.1475-1305.2007.00353.x
Subject(s) - line (geometry) , gauge (firearms) , substrate (aquarium) , poisson distribution , materials science , bounded function , line width , simple (philosophy) , gauge factor , poisson's ratio , geometry , finite element method , composite material , structural engineering , mathematical analysis , mathematics , optics , physics , engineering , statistics , geology , metallurgy , philosophy , alternative medicine , oceanography , pathology , epistemology , fabrication , medicine
A semi‐analytical approach is taken to calculate the geometric contribution to gauge factor for patterned lines on substrates. A finite element model is presented in which a line section is strained along its length, and cross‐sectional dilatation is calculated for different line aspect ratios, and elastic properties of line and substrate. Results are bounded by analytical solutions for infinitely wide and tall lines. A simple experiment is posed for measuring Poisson's ratio and piezoresistivity of coatings, films or patterned structures.