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Phase shifting method for retroreflective grating analysis
Author(s) -
Zhang Xianzhu,
North Walter P.T.
Publication year - 1998
Publication title -
strain
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.477
H-Index - 47
eISSN - 1475-1305
pISSN - 0039-2103
DOI - 10.1111/j.1475-1305.1998.tb01100.x
Subject(s) - grating , materials science , optics , phase (matter) , optoelectronics , physics , quantum mechanics
A phase shifted retroreflective grating system has been presented for measuring the derivative and contour of quasi flat specular surfaces. The system has been tested with a small indent of maximum depth less than 10 microns. The experiment shows that the system can tell the defect size, shape and polarity (indent/outdent). The method can be developed for industrial application in nondestructive testing and evaluation(NDTE).